Hi,
We are doing a 2kW LLC half bridge with vout = 180vdc, vin = 400vdc, f(sw)~100kHz.
The hi side fet will be driven by having a hi side, 15v supply referred to the switching node. A gate driver will be powered by this and will drive the hi fet. The signal to this hi iside gate driver will be provided by either a NCP5181, or a 2ED2101S06F……
2ED2101S06F data
NCP5181 datasheet
https://www.onsemi.com/pdf/datasheet/ncp5106-d.pdf
Page 16 of the NCP5181 datasheet (above) warns of the problem of damaging latch up of the part if Vs spikes occur and go too low.
However, the 2ED2101S06F web page states that this latch up is not a problem..quoting them…
“Based on our SOI-Technology, the 2ED2101S06F has excellent ruggedness and noise immunity against
negative transient voltages on VS pin. With no parasitic thyristor structures present in the device, no parasitic
latch up can occur over all temperature and voltage conditions.”
So would you agree that the 2ED2101S06F is much more reliable? Is the NCP5181 a bit dodgy?
We are doing a 2kW LLC half bridge with vout = 180vdc, vin = 400vdc, f(sw)~100kHz.
The hi side fet will be driven by having a hi side, 15v supply referred to the switching node. A gate driver will be powered by this and will drive the hi fet. The signal to this hi iside gate driver will be provided by either a NCP5181, or a 2ED2101S06F……
2ED2101S06F data
NCP5181 datasheet
https://www.onsemi.com/pdf/datasheet/ncp5106-d.pdf
Page 16 of the NCP5181 datasheet (above) warns of the problem of damaging latch up of the part if Vs spikes occur and go too low.
However, the 2ED2101S06F web page states that this latch up is not a problem..quoting them…
“Based on our SOI-Technology, the 2ED2101S06F has excellent ruggedness and noise immunity against
negative transient voltages on VS pin. With no parasitic thyristor structures present in the device, no parasitic
latch up can occur over all temperature and voltage conditions.”
So would you agree that the 2ED2101S06F is much more reliable? Is the NCP5181 a bit dodgy?