I'm not sure I can help, but when I used to do thin film resistivity measurements. Force and sense could be arbitrarily arranged I+, V+, I-, V- Around the bulk material. The probes were electrically rotated and an I-V curve generated again. With perfect symmetry and homoginity, the lines would lie on top of one another, A formula was applied and the ohms/square was derived. Some wierd function was applied if the curves were way off. It's some paper for measuring resistivity using a 4 probe method. Units were ohms/square.
Not sure how to get a force sense using your chip. Resistivity required the thickness.
An inline method could be used too with 4 probes. I on the outside and measured V on the inside, Polarity was reversed as a check. probe distances and currents were designed so that the result was ohms/square Look for 4 point probe for measuring sheet resistance.