Mosaic
Well-Known Member
Hi all:
I have a hi energy (1Khz) pulse circuit design. A bank of 4 IRFP3306 NFETS driven by an MCP1407 FET driver that is fed by an optoisolated pulse.
Have a look at the schematic Pic. The switching discharges a low ESR capacitor Bank. Up to 700A peak over a few dozen microsecs.
The MCP1407 output passes thru a 500mA ferrite bead and then splits into 4, 5 ohm gate drive resistors. I note the ferrite bead has a 30C delta temp at peak DC% of 50%.
I have had about 8 driver failures over the last year. The initial failures were quick, after an hour or so, which resulted in adding the ferrite bead, an 18V clamping zener on the FETdriver output and additional decoupling caps. Things seemed ok afterward.
Now, after about 600 hours of runtime, cumulative over about 6 months the FETdriver pops again. The driver input signal switched by the 2n3906 is 12V Hi. Failure mode is the FET driver input pulldown 150ohm (collector resistor load on the 2n3906 transistor) no longer pulls to ground, only to about 5V. There seems to be something preventing the FETdriver input from being pulled low. This causes the FETdriver output to lock hi, overdriving the output FET bank. Simply swapping in a new MCP1407 FETdriver restores normal function.
Also, I noted just before the 'failure' of the FETdriver that I started seeing/hearing erratic output pulses, as though signal pulses were either being missed or lasted too long. The pulses are audible (capacitive piezo effect) and abnormal behaviour is easily heard and viewed on a 'scope.
I was looking for some suggestions as to how to rectify this reliability issue. The operating temp of the circuit is around 50C peak (30C ambient).
For now I am planning to change out the gate drive resistors to 10 ohm rather than 5 ohm to relieve some of the loading on the FETdriver and further inhibit ringing. Of course, with a 600 hour test ahead of me, getting it wrong is costly in being unable to get past this. BTW I have a small heatsink on the MCP1407 as a precaution. It runs warm to touch.
I have a hi energy (1Khz) pulse circuit design. A bank of 4 IRFP3306 NFETS driven by an MCP1407 FET driver that is fed by an optoisolated pulse.
Have a look at the schematic Pic. The switching discharges a low ESR capacitor Bank. Up to 700A peak over a few dozen microsecs.
The MCP1407 output passes thru a 500mA ferrite bead and then splits into 4, 5 ohm gate drive resistors. I note the ferrite bead has a 30C delta temp at peak DC% of 50%.
I have had about 8 driver failures over the last year. The initial failures were quick, after an hour or so, which resulted in adding the ferrite bead, an 18V clamping zener on the FETdriver output and additional decoupling caps. Things seemed ok afterward.
Now, after about 600 hours of runtime, cumulative over about 6 months the FETdriver pops again. The driver input signal switched by the 2n3906 is 12V Hi. Failure mode is the FET driver input pulldown 150ohm (collector resistor load on the 2n3906 transistor) no longer pulls to ground, only to about 5V. There seems to be something preventing the FETdriver input from being pulled low. This causes the FETdriver output to lock hi, overdriving the output FET bank. Simply swapping in a new MCP1407 FETdriver restores normal function.
Also, I noted just before the 'failure' of the FETdriver that I started seeing/hearing erratic output pulses, as though signal pulses were either being missed or lasted too long. The pulses are audible (capacitive piezo effect) and abnormal behaviour is easily heard and viewed on a 'scope.
I was looking for some suggestions as to how to rectify this reliability issue. The operating temp of the circuit is around 50C peak (30C ambient).
For now I am planning to change out the gate drive resistors to 10 ohm rather than 5 ohm to relieve some of the loading on the FETdriver and further inhibit ringing. Of course, with a 600 hour test ahead of me, getting it wrong is costly in being unable to get past this. BTW I have a small heatsink on the MCP1407 as a precaution. It runs warm to touch.